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  integrated silicon solution, inc. ? www.issi.com ? 1-800-379-4774 1 rev. d 12/06/05 issi ? copyright ? 2005 integrated silicon solution, inc. all rights reserved. issi reserves the right to make changes to this speci fication and its products at any time without notice. issi assumes no liability arising out of the application or use of any information, products or services desc ribed herein. customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders fo r products. is61lv51216 is64lv51216 features ? high-speed access time: ? 8, 10, and 12 ns ? cmos low power operation ? low stand-by power: ? less than 5 m a (typ.) cmos stand-by ? ttl compatible interface levels ? single 3.3v power supply ? fully static operation: no clock or refresh required ? three state outputs ? data control for upper and lower bytes ? industrial and automotive temperatures available ? lead-free available 512k x 16 high speed asynchronous cmos static ram with 3.3v supply description the issi is61/64lv51216 is a high-speed, 8m-bit static ram organized as 525,288 words by 16 bits. it is fabricated using issi 's high-performance cmos technology. this highly reliable process coupled with innovative circuit de- sign techniques, yields high-performance and low power consumption devices. when ce is high (deselected), the device assumes a standby mode at which the power dissipation can be reduced down with cmos input levels. easy memory expansion is provided by using chip enable and output enable inputs, ce and oe . the active low write enable ( we ) controls both writing and reading of the memory. a data byte allows upper byte ( ub ) and lower byte ( lb ) access. the is61/64lv51216 is packaged in the jedec standard 44-pin tsop type ii and 48-pin mini bga (9mm x 11mm). functional block diagram december 2005 a0-a18 ce oe we 512k x 16 memory array decoder column i/o control circuit gnd vdd i/o data circuit i/o0-i/o7 lower byte i/o8-i/o15 upper byte ub lb
2 integrated silicon solution, inc. ? www.issi.com ? 1-800-379-4774 rev. d 12/06/05 issi ? is61lv51216 is64lv51216 truth table i/o pin mode we we we we we ce ce ce ce ce oe oe oe oe oe lb lb lb lb lb ub ub ub ub ub i/o0-i/o7 i/o8-i/o15 v dd current not selected x h x x x high-z high-z i sb 1 , i sb 2 output disabled h l h x x high-z high-z i cc x l x h h high-z high-z read h l l l h d out high-z i cc h l l h l high-z d out hllll d out d out write l l x l h d in high-z i cc l l x h l high-z d in llxll d in d in pin descriptions a0-a18 address inputs i/o0-i/o15 data inputs/outputs ce chip enable input oe output enable input we write enable input lb lower-byte control (i/o0-i/o7) ub upper-byte control (i/o8-i/o15) nc no connection v dd power gnd ground 44-pin tsop (type ii) 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 1 9 20 21 22 44 43 42 41 40 3 9 38 37 36 35 34 33 32 31 30 2 9 28 27 26 25 24 23 a0 a1 a2 a3 a4 ce i/o0 i/o1 i/o2 i/o3 vdd gnd i/o4 i/o5 i/o6 i/o7 we a5 a6 a7 a8 a 9 a17 a16 a15 oe ub lb i/o15 i/o14 i/o13 i/o12 gnd vdd i/o11 i/o10 i/o 9 i/o8 a18 a14 a13 a12 a11 a10 pin configurations
integrated silicon solution, inc. ? www.issi.com ? 1-800-379-4774 3 rev. d 12/06/05 1 2 3 4 5 6 7 8 9 10 11 12 issi ? is61lv51216 is64lv51216 absolute maximum ratings (1) symbol parameter value unit v term terminal voltage with respect to gnd ?0.5 to v dd +0.5 v v dd v dd related to gnd ?0.3 to +4.0 v t stg storage temperature ?65 to +150 c p t power dissipation 1.0 w note: 1. stress greater than those listed under absolute maximum ratings may cause permanent damage to the device. this is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operati onal sections of this specification is not implied. exposure to absolute maximum rating conditions for extended periods may affect reliability. 48-pin mini bga (9mmx11mm) 1 2 3 4 5 6 a b c d e f g h lb oe a0 a1 a2 n/c i/o 8 ub a3 a4 ce i/o 0 i/o 9 i/o 10 a5 a6 i/o 1 i/o 2 gnd i/o 11 a17 a7 i/o 3 vdd vdd i/o 12 gnd a16 i/o 4 gnd i/o 14 i/o 13 a14 a15 i/o 5 i/o 6 i/o 15 nc a12 a13 we i/o 7 a18 a8 a 9 a10 a11 nc pin configurations pin descriptions a0-a18 address inputs i/o0-i/o15 data inputs/outputs ce chip enable input oe output enable input we write enable input lb lower-byte control (i/o0-i/o7) ub upper-byte control (i/o8-i/o15) nc no connection v dd power gnd ground
4 integrated silicon solution, inc. ? www.issi.com ? 1-800-379-4774 rev. d 12/06/05 issi ? is61lv51216 is64lv51216 power supply characteristics (1) (over operating range) -8 -10 -12 symbol p arameter test conditions min. max. min. max. min. max. unit i cc v dd dynamic operating v dd = max., com. ? 110 ? 100 ? 90 ma supply current i out = 0 ma, f = f max ind. ? 120 ? 110 ? 100 auto. ? 120 i sb 1 ttl standby current v dd = max., com. ? 30 ? 30 ? 30 ma (ttl inputs) v in = v ih or v il ind. ? 35 ? 35 ? 35 ce v ih , f = 0 auto. ? 40 i sb 2 cmos standby v dd = max., com. ? 20 ? 20 ? 20 ma current (cmos inputs) ce v dd ? 0.2v, ind. ? 25 ? 25 ? 25 v in v dd ? 0.2v, or auto. ? 30 v in 0.2v, f = 0 note: 1. at f = f max , address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change. dc electrical characteristics (over operating range) symbol parameter test conditions min. max. unit v oh output high voltage v dd = min., i oh = ?4.0 ma 2.4 ? v v ol output low voltage v dd = min., i ol = 8.0 ma ? 0.4 v v ih input high voltage 2.2 v dd + 0.3 v v il input low voltage (1) ?0.3 0.8 v i li input leakage gnd v in v dd com. ?1 1 a ind. ?5 5 auto. -10 -10 i lo output leakage gnd v out v dd com. ?1 1 a outputs disabled ind. ?5 5 auto. -10 -10 notes: 1. v il (min.) = ?2.0v for pulse width less than 10 ns. operating range range ambient temperature v dd commercial 0c to +70c 3.3v +10%, -5% industrial ?40c to +85c 3.3v +10%, -5% automotive ?40c to +125c 3.3v +10%, -5%
integrated silicon solution, inc. ? www.issi.com ? 1-800-379-4774 5 rev. d 12/06/05 1 2 3 4 5 6 7 8 9 10 11 12 issi ? is61lv51216 is64lv51216 capacitance (1) symbol parameter cond itions max. unit c in input capacitance v in = 0v 6 pf c out input/output capacitance v out = 0v 8 pf note: 1. tested initially and after any design or process changes that may affect these parameters. ac test loads figure 1 figure 2 31 9 5 pf including jig and scope 353 output 3.3v z o = 50 1.5v 50 output 30 pf including jig and scope ac test conditions parameter unit input pulse level 0v to 3.0v input rise and fall times 3 ns input and output timing 1.5v and reference level output load see figures 1 and 2
6 integrated silicon solution, inc. ? www.issi.com ? 1-800-379-4774 rev. d 12/06/05 issi ? is61lv51216 is64lv51216 data valid read1.eps previous data valid t aa t oha t oha t rc d out address ac waveforms read cycle no. 1 (1,2) (address controlled) ( ce = oe = v il , ub or lb = v il ) read cycle switching characteristics (1) (over operating range) -8 -10 -12 symbol parameter min. max. min. max. min. max. unit t rc read cycle time 8 ? 10 ? 12 ? ns t aa address access time ? 8 ? 10 ? 12 ns t oha output hold time 3 ? 3 ? 3 ? ns t ace ce access time ? 8 ? 10 ? 12 ns t doe oe access time ? 3.5 ? 4 ? 5 ns t hzoe (2) oe to high-z output ? 3 ? 4 0 5 ns t lzoe (2) oe to low-z output 0 ? 0 ? 0 ? ns t hzce (2 ce to high-z output 0 3 0 4 0 6 ns t lzce (2) ce to low-z output 3 ? 3 ? 3 ? ns t ba lb , ub access time ? 3.5 ? 4 ? 5 ns t hzb (2) lb , ub to high-z output 0 3 0 3 0 4 ns t lzb (2) lb , ub to low-z output 0 ? 0 ? 0 ? ns t pu power up time 0 ? 0 ? 0 ? ns t pd power down time ? 8 ? 10 ? 12 ns notes: 1. test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5v, input pulse levels of 0v to 3.0v and output loading specified in figure 1. 2. tested with the load in figure 2. transition is measured 500 mv from steady-state voltage.
integrated silicon solution, inc. ? www.issi.com ? 1-800-379-4774 7 rev. d 12/06/05 1 2 3 4 5 6 7 8 9 10 11 12 issi ? is61lv51216 is64lv51216 t rc t oha t aa t doe t lzoe t ace t lzce t hzoe high-z data valid ub_cedr2.eps t hzb address oe ce lb , ub d out t hzce t ba t lzb t rc t pd i sb i cc 50% v dd supply current 50% t pu read cycle no. 2 (1,3) notes: 1. we is high for a read cycle. 2. the device is continuously selected. oe , ce , ub , or lb = v il . 3. address is valid prior to or coincident with ce low transition.
8 integrated silicon solution, inc. ? www.issi.com ? 1-800-379-4774 rev. d 12/06/05 issi ? is61lv51216 is64lv51216 write cycle switching characteristics (1,3) (over operating range) -8 -10 -12 symbol parameter min. max. min. max. min. max. unit t wc write cycle time 8 ? 10 ? 12 ? ns t sce ce to write end 6.5 ? 8 ? 8 ? ns t aw address setup time 6.5 ? 8 ? 8 ? ns to write end t ha address hold from write end 0 ? 0 ? 0 ? ns t sa address setup time 0 ? 0 ? 0 ? ns t pwb lb , ub valid to end of write 6.5 ? 8 ? 8 ? ns t pwe 1 we pulse width 6.5 ? 8 ? 8 ? ns t pwe 2 we pulse width ( oe = low) 8.0 ? 10 ? 12 ? ns t sd data setup to write end 5 ? 6 ? 6 ? ns t hd data hold from write end 0 ? 0 ? 0 ? ns t hzwe (2) we low to high-z output ? 3.5 ? 5 ? 6 ns t lzwe (2) we high to low-z output 2 ? 2 ? 2 ? ns notes: 1. test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5v, input pulse levels of 0v to 3.0v and output loading specified in figure 1. 2. tested with the load in figure 2. transition is measured 500 mv from steady-state voltage. not 100% tested. 3. the internal write time is defined by the overlap of ce low and ub or lb , and we low. all signals must be in valid states to initiate a write, but any one can go inactive to terminate the write. the data input setup and hold timing are referenced to the rising or falling edge of the signal that terminates the write. shaded area product in development
integrated silicon solution, inc. ? www.issi.com ? 1-800-379-4774 9 rev. d 12/06/05 1 2 3 4 5 6 7 8 9 10 11 12 issi ? is61lv51216 is64lv51216 notes: 1. write is an internally generated signal asserted during an overlap of the low states on the ce and we inputs and at least one of the lb and ub inputs being in the low state. 2. write = ( ce ) [ ( lb ) = ( ub ) ] ( we ). ac waveforms write cycle no. 1 ( ce controlled, oe is high or low) (1 ) data undefined t wc valid address t sce t pwe1 t pwe2 t aw t ha high-z t pbw t hd t sa t hzwe address ce ub , lb we d out d in data in valid t lzwe t sd ub_cewr1.eps
10 integrated silicon solution, inc. ? www.issi.com ? 1-800-379-4774 rev. d 12/06/05 issi ? is61lv51216 is64lv51216 ac waveforms write cycle no. 2 ( we controlled. oe is high during write cycle) (1,2) data undefined low t wc valid address t pwe1 t aw t ha high-z t pbw t hd t sa t hzwe address ce ub , lb we d out d in oe data in valid t lzwe t sd ub_cewr2.eps write cycle no. 3 ( we controlled. oe is low during write cycle) (1) data undefined t wc valid address low low t pwe2 t aw t ha high-z t pbw t hd t sa t hzwe address ce ub , lb we d out d in oe data in valid t lzwe t sd ub_cewr3.eps
integrated silicon solution, inc. ? www.issi.com ? 1-800-379-4774 11 rev. d 12/06/05 1 2 3 4 5 6 7 8 9 10 11 12 issi ? is61lv51216 is64lv51216 ac waveforms write cycle no. 4 ( lb , ub controlled, back-to-back write) (1,3) data undefined t wc address 1 address 2 t wc high-z t pbw word 1 low word 2 ub_cewr4.eps t hd t sa t hzwe address ce ub , lb we d out d in oe data in valid t lzwe t sd t pbw data in valid t sd t hd t sa t ha t ha notes: 1. the internal write time is defined by the overlap of ce = low, ub and/or lb = low, and we = low. all signals must be in valid states to initiate a write, but any can be deasserted to terminate the write. the t sa , t ha , t sd , and t hd timing is referenced to the rising or falling edge of the signal that terminates the write. 2. tested with oe high for a minimum of 4 ns before we = low to place the i/o in a high-z state. 3. we may be held low across many address cycles and the lb , ub pins can be used to control the write function.
12 integrated silicon solution, inc. ? www.issi.com ? 1-800-379-4774 rev. d 12/06/05 issi ? is61lv51216 is64lv51216 ordering information: commercial range: 0c to +70c speed order p art no. package (ns) 8 is61lv51216-8t tsop (type ii) is61lv51216-8tl tsop (type ii), lead-free is61lv51216-8m mini bga (9mm x 11mm) 10 is61lv51216-10t tsop (type ii) is61lv51216-10m mini bga (9mm x 11mm) 12 is61lv51216-12t tsop (type ii) industrial range: ?40c to +85c speed order p art no. package (ns) 8 is61lv51216-8ti tsop (type ii) is61lv51216-8mi mini bga (9mm x 11mm) 10 is61lv51216-10ti tsop (type ii) is61lv51216-10tli tsop (type ii), lead-free is61lv51216-10mi mini bga (9mm x 11mm) is61lv51216-10mli mini bga (9mm x 11mm), lead-free 12 is61lv51216-12ti tsop (type ii) automotive range: ?40c to +125c speed order p art no. package (ns) 12 is64lv51216-12ta3 tsop (type ii) (1) IS64LV51216-12TLA3 tsop (type ii) (1) , lead-free note: 1. copper leadframe
packaging information issi ? integrated silicon solution, inc. ? www.issi.com ? 1-800-379-4774 rev. d 01/15/03 copyright ? 2003 integrated silicon solution, inc. all rights reserved. issi reserves the right to make changes to this speci fication and its products at any time without notice. issi assumes no liability arising out of the application or use of any information, products or services desc ribed herein. customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders fo r products. mini ball grid array package code: m (48-pin) notes: 1. controlling dimensions are in millimeters. seating plane a a1 a2 a b c d e f g h e e d1 e1 e d b (48x) top view bottom view 6 5 4 3 2 1 1 2 3 4 5 6 a b c d e f g h
packaging information issi ? 2 integrated silicon solution, inc. ? www.issi.com ? 1-800-379-4774 rev. d 01/15/03 mbga - 7.2mm x 8.7mm millimeters inches sym. min. typ. max. min. typ. max. n0. leads 48 a 1.20 0.047 a1 0 .24 0.30 0.009 0.012 a2 0.60 0.024 d 8.60 8.70 8.80 0.339 0.343 0.346 d1 5.25bsc 0.207bsc e 7.10 7.20 7.30 0.280 0.283 0.287 e1 3.75bsc 0.148bsc e 0.75bsc 0.030bsc b 0.30 0.35 0.40 0.012 0.014 0.016 mbga - 9mm x 11mm millimeters inches sym. min. typ. max. min. typ. max. n0. leads 48 a 1.20 0.047 a1 0.24 0.30 0.009 0.012 a2 0.60 0.024 d 10.90 11.00 11.10 0.429 0.433 0.437 d1 5.25bsc 0.207bsc e 8.90 9.00 9.10 0.350 0.354 0.358 e1 3.75bsc 0.148bsc e 0.75bsc 0.030bsc b 0.30 0.35 0.40 0.012 0.014 0.016 mbga - 6mm x 8mm millimeters inches sym. min. typ. max. min. typ. max. n0. leads 48 a 1.20 . 0.047 a1 0.25 0.40 0.010 0.016 a2 0.60 0.024 d 7.90 8.00 8.10 0.311 0.314 0.319 d1 5.60bsc 0.220bsc e 5.90 6.00 6.10 0.232 0.236 0.240 e1 4.00bsc 0.157bsc e 0.80bsc 0.031bsc b 0.40 0.45 0.50 0.016 0.018 0.020 mini ball grid array package code: m (48-pin)
packaging information issi ? integrated silicon solution, inc. ? www.issi.com ? 1-800-379-4774 rev. f 06/18/03 copyright ? 2003 integrated silicon solution, inc. all rights reserved. issi reserves the right to make changes to this speci fication and its products at any time without notice. issi assumes no liability arising out of the application or use of any information, products or services desc ribed herein. customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders fo r products. plastic tsop package code: t (type ii) d seating plane b e c 1 n/2 n/2+1 n e1 a1 a e l zd . notes: 1. controlling dimension: millimieters, unless otherwise specified. 2. bsc = basic lead spacing between centers. 3. dimensions d and e1 do not include mold flash protrusions and should be measured from the bottom of the package. 4. formed leads shall be planar with respect to one another within 0.004 inches at the seating plane. plastic tsop (t - type ii) millimeters inches millimeters inches millimeters inches symbol min max min max min max min max min max min max ref. std. no. leads (n) 32 44 50 a ? 1.20 ? 0.047 ? 1.20 ? 0.047 ? 1.20 ? 0.047 a1 0.05 0.15 0.002 0.006 0.05 0.15 0.002 0.006 0.05 0.15 0.002 0.006 b 0.30 0.52 0.012 0.020 0.30 0.45 0.012 0.018 0.30 0.45 0.012 0.018 c 0.12 0.21 0.005 0.008 0.12 0.21 0.005 0.008 0.12 0.21 0.005 0.008 d 20.82 21.08 0.820 0.830 18.31 18.52 0.721 0.729 20.82 21.08 0.820 0.830 e1 10.03 10.29 0.391 0.400 10.03 10.29 0.395 0.405 10.03 10.29 0.395 0.405 e 11.56 11.96 0.451 0.466 11.56 11.96 0.455 0.471 11.56 11.96 0.455 0.471 e 1.27 bsc 0.050 bsc 0.80 bsc 0.032 bsc 0.80 bsc 0.031 bsc l 0.40 0.60 0.016 0.024 0.41 0.60 0.016 0.024 0.40 0.60 0.016 0.024 zd 0.95 ref 0.037 ref 0.81 ref 0.032 ref 0.88 ref 0.035 ref 0 5 0 5 0 5 0 5 0 5 0 5


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